부품 번호 TS268PARENU

Semiconductor Device Test Set

가격 및 가용성

이 NSN의 현재 가격 및 가용성에 대해 이 양식을 제출하십시오.
부품 번호:
양:
이메일 주소:
전화:
참조:
회사:
이름:

우리는 귀하의 정보를 누구에게도 공유하거나 판매하지 않습니다.
사생활 | 용어

All major credit cards accepted as well as gov. p-cards

이 제품의 과거 가격은 918 and 1239.3 USD. 수량, 가용성, 상태, 리드 타임 및 품목 중단 가능성에 따라 최신 견적을 제공할 때까지 가격을 보장할 수 없습니다.

부품 번호
비무장화
수명
UOM
NIIN
부품 번호:
ts268parenu
비무장화:
Yes - DEMIL/MLI
수명:
N/A
측정 단위:
1 EA
NIIN:
005570398
NSN
국가 주식 번호:
6625-00-557-0398 6625005570398
TXT
묘사:
Semiconductor Device Test Set
INC
INC
아이템 이름 코드:
25006
INC
COM
컴플라이언스:
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
6.000 inches
MRC:
A measurement of the longest dimension of any object,in distinction from width.ABRY
Length:
8.180 inches
MRC:
The value,or range of values,of direct current potential for which the item is rated.ACYR
Dc Voltage Rating:
1.5 volts
MRC:
An indication of whether or not a facility/ies/ to accommodate a battery/ies/ is included.ALSF
Internal Battery Accommodation:
Included
MRC:
The element,compound,or mixture of which the item is fabricated,excluding any surface treatment,and its location.ANNQ
Material And Location:
Aluminum housing
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Measurement of resistance and current
MRC:
The testing functions such as range,sensitivity,output,and the like,for which the item is designed.AQXZ
Operating Test Capability:
Multimeter range 0 to 1 ma of ammeter range 0 to 10000 ohms of ohmeter
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
3.620 inches
MRC:
The number,letter,or symbol that indicates the type,style,grade,class,and the like,of an item in a nonidentifying specification or standard.ZZZT
Specification Or Standard:
Ts-268/u type
MRC:
The justification for the assignment of a federal supply class /fsc/ to an item based on the classification of the next higher classifiable assembly.ZZZV
Fsc Application Data:
Test set, semiconductor device

{lang[cimilar]} Semiconductor Device Test Sets

« Electrical and Electronic Properties Measuring and Testing Instruments {lang[catalog]}
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