부품 번호 TS268EU

Semiconductor Device Test Set

가격 및 가용성

이 NSN의 현재 가격 및 가용성에 대해 이 양식을 제출하십시오.
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이메일 주소:
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우리는 귀하의 정보를 누구에게도 공유하거나 판매하지 않습니다.
사생활 | 용어

All major credit cards accepted as well as gov. p-cards
부품 번호
비무장화
수명
UOM
NIIN
부품 번호:
ts268eu
비무장화:
No
수명:
측정 단위:
NIIN:
009236534
NSN
국가 주식 번호:
6625-00-923-6534 6625009236534
TXT
묘사:
Semiconductor Device Test Set
INC
INC
아이템 이름 코드:
25006
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
6.000 inches
MRC:
A measurement of the longest dimension of any object,in distinction from width.ABRY
Length:
8.187 inches
MRC:
An indication of whether or not a facility/ies/ to accommodate a battery/ies/ is included.ALSF
Internal Battery Accommodation:
Included
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/carrying case
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Front resistance of crystal; back resistance of crystal; back current of crystal
MRC:
The testing functions such as range,sensitivity,output,and the like,for which the item is designed.AQXZ
Operating Test Capability:
Front resistance-not greater than 0.5 kilohm for a good crystal; back resistance-ratio of back to front resistance greater than 10 to 1 for a good crystal; back current-crystal should not indicate current greater than - crystal in21 and in23, in23a, in25, in21a and in23b, in21b, in26 we, in26 syl, in78 syl - current d. C. 0.400 ma, 0.300 ma, 0.250 ma, 0.175 ma, 0.125 ma, 0.110 ma, 0.230 ma, 0.160 ma
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
3.625 inches

{lang[cimilar]} Semiconductor Device Test Sets

« Electrical and Electronic Properties Measuring and Testing Instruments {lang[catalog]}
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