부품 번호 TS1836CU

Semiconductor Device Test Set

가격 및 가용성

이 NSN의 현재 가격 및 가용성에 대해 이 양식을 제출하십시오.
부품 번호:
양:
이메일 주소:
전화:
참조:
회사:
이름:

우리는 귀하의 정보를 누구에게도 공유하거나 판매하지 않습니다.
사생활 | 용어

All major credit cards accepted as well as gov. p-cards

이 제품의 과거 가격은 193.68 and 261.468 USD. 수량, 가용성, 상태, 리드 타임 및 품목 중단 가능성에 따라 최신 견적을 제공할 때까지 가격을 보장할 수 없습니다.

부품 번호
비무장화
수명
UOM
NIIN
부품 번호:
ts1836cu
비무장화:
Yes - DEMIL/MLI
수명:
N/A
측정 단위:
1 EA
NIIN:
001592263
NSN
국가 주식 번호:
6625-00-159-2263 6625001592263
TXT
묘사:
Semiconductor Device Test Set
INC
INC
아이템 이름 코드:
25006
INC
COM
컴플라이언스:
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
7.000 inches
MRC:
A measurement of the longest dimension of any object,in distinction from width.ABRY
Length:
6.500 inches
MRC:
The value,or range of values,of direct current potential for which the item is rated.ACYR
Dc Voltage Rating:
9.0 volts
MRC:
The principal parts that are included in an assembled unit.AEAS
Major Components:
Test leads
MRC:
The number of parts supplied with the item which may be required for application.AFHS
Accessory Component Quantity:
3
MRC:
The name assigned to the item by the joint electronics type designation system.AKWA
Joint Electronics Type Designation System Item Name:
Test set, transistor
MRC:
The type number assigned to the item by the joint electronics type designation system.AKWB
Joint Electronics Type Designation System Item Type Number:
Ts-1836c/u
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of whether or not a facility/ies/ to accommodate a battery/ies/ is included.ALSF
Internal Battery Accommodation:
Included
MRC:
The element,compound,or mixture of which the item is fabricated,excluding any surface treatment,and its location.ANNQ
Material And Location:
Plastic carrying case
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/carrying case
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Transistor beta; electrode resistance and current; field effect transistor, diode and rectifier
MRC:
The testing functions such as range,sensitivity,output,and the like,for which the item is designed.AQXZ
Operating Test Capability:
Beta test range 1 to 100 porm 5 pct out of circuit, 10 to 1000 porm 5 pct in circuit, 1 to 100 porm 10 pct 500 ohm load emitter to base, 10 to 1000 porm 10 pct 500 ohm load emitter to base; electrode resistance range 0 to 5000 porm 5 pct emitter to base, 0 to 5000 porm 5 pct collector to base, 0 to 5000 porm 5 pct collector to emmitter; electrode current range 0 to 100 ua porm 3 pct full scale collector cut off emitter open, 0 to 1 ma porm 3 pct full scale; collector cut off emitter open; fieldeffect transistor gain maximum or min range 0 to 2500 micromhosporm 5 pct out ofcircuit, 0 to 2500 micromhos porm 10 pct in circuit; gate source load 100 ohms; drain source load 4000 ohm; diode current range 0 to 100 ua porm 3 pct full scale, 0 to 1 ma porm 3 pct full scale; diode reverse to forward ratio 1, 10 porm 5 pct
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
8.500 inches

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