부품 번호 TS-268CU

Semiconductor Device Test Set

가격 및 가용성

이 NSN의 현재 가격 및 가용성에 대해 이 양식을 제출하십시오.
부품 번호:
양:
이메일 주소:
전화:
참조:
회사:
이름:

우리는 귀하의 정보를 누구에게도 공유하거나 판매하지 않습니다.
사생활 | 용어

All major credit cards accepted as well as gov. p-cards
부품 번호
비무장화
수명
UOM
NIIN
부품 번호:
ts-268cu
비무장화:
No
수명:
측정 단위:
NIIN:
006445754
NSN
국가 주식 번호:
6625-00-644-5754 6625006445754
TXT
묘사:
Semiconductor Device Test Set
INC
INC
아이템 이름 코드:
25006
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
5.500 inches
MRC:
A measurement of the longest dimension of any object,in distinction from width.ABRY
Length:
7.870 inches
MRC:
The value,or range of values,of direct current potential for which the item is rated.ACYR
Dc Voltage Rating:
1.5 volts
MRC:
The principal parts that are included in an assembled unit.AEAS
Major Components:
All components and accessories listed in tm11-215
MRC:
An indication of whether or not a facility/ies/ to accommodate a battery/ies/ is included.ALSF
Internal Battery Accommodation:
Included
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/carrying case
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Current measurement, resistance measurement
MRC:
The testing functions such as range,sensitivity,output,and the like,for which the item is designed.AQXZ
Operating Test Capability:
Crystal tester, indicates good crystal-poor crystal, current range 0 to 1 ma, resistance range 0 to infinity in kilohms, five color indication scales, green for good-red for poor
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
3.620 inches

{lang[cimilar]} Semiconductor Device Test Sets

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