부품 정보
Unit requires ibm compatible compter and monitor; probe inputs: 2 banana jacks and 1 bnc connector; scanner inputs: 16, 30, 40, and 64 input connections; rs232 interface at 9600 baud; database management system for failure history and statistical reports
TXT
묘사:
Semiconductor Device Test Set
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
12.250 inches
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
Between 85.0 volts and 250.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
MRC:
A linear measurement from the surface to a specified inner point on an item,in distinction from height.AEJZ
Depth:
12.250 inches
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Impedance range: 100k, 10k, 1k, and 100 ohms; test frequencies: 60, 2000 hz sinewave
MRC:
The number of alternating current phases.FAAZ
Phase:
Single
MRC:
Describes the capabilities,intended use,and/or purpose for which the item is provided.FTLD
Functional Description:
General purpose troubleshooting system designed to test a variety of electronic circuits using menu driven software
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
3.000 inches
