부품 번호 MIL-HDBK-300PME

Semiconductor Device Test Set

가격 및 가용성

이 NSN의 현재 가격 및 가용성에 대해 이 양식을 제출하십시오.
부품 번호:
양:
이메일 주소:
전화:
참조:
회사:
이름:

우리는 귀하의 정보를 누구에게도 공유하거나 판매하지 않습니다.
사생활 | 용어

All major credit cards accepted as well as gov. p-cards

이 제품의 과거 가격은 4283.5 and 5601.5 USD. 수량, 가용성, 상태, 리드 타임 및 품목 중단 가능성에 따라 최신 견적을 제공할 때까지 가격을 보장할 수 없습니다.

부품 번호
비무장화
수명
UOM
NIIN
부품 번호:
mil-hdbk-300pme
비무장화:
Yes - DEMIL/MLI
수명:
N/A
측정 단위:
1 EA
NIIN:
015814169
NSN
국가 주식 번호:
6625-01-581-4169 6625015814169
TXT
묘사:
Semiconductor Device Test Set
INC
INC
아이템 이름 코드:
25006
INC
COM
컴플라이언스:
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
11.100 inches
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
100.0 volts or 115.0 volts or 230.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
MRC:
A linear measurement from the surface to a specified inner point on an item,in distinction from height.AEJZ
Depth:
8.500 inches
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Resistance, capacitance, inductance
MRC:
The testing functions such as range,sensitivity,output,and the like,for which the item is designed.AQXZ
Operating Test Capability:
Frequencies 20, 50, 60, 200, 500, and 2khz; voltages 200milli, 3, 5, 10, 15, and 20v; resistance 10, 50, 100, 500, 1k, 5k, 10k, 50k, 100k ohms
MRC:
The number of alternating current phases.FAAZ
Phase:
Single
MRC:
The alpha-numeric designation that identifies the classification of the item according to the category of functions performed.FCLS
Functional Classification:
Aa-1.3
MRC:
Describes the capabilities,intended use,and/or purpose for which the item is provided.FTLD
Functional Description:
Used to test passive devices, diodes, transistors, gated devices, optoelectronic devices, and integrated circuits
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
4.400 inches
MRC:
Indicates the date the item was entered into mil-hdbk-300.NTRD
Entry Date:
10-01-14
MRC:
Indicates the relationship,such as construction,capabilities,and the like,of the item to a similar item.RTSE
Relationship To Similar Equipment:
Tracker 2800s can scan multi-pin

{lang[cimilar]} Semiconductor Device Test Sets

« Electrical and Electronic Properties Measuring and Testing Instruments {lang[catalog]}
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