부품 번호 MIL-HDBK-300ATS

Semiconductor Device Test Set

가격 및 가용성

이 NSN의 현재 가격 및 가용성에 대해 이 양식을 제출하십시오.
부품 번호:
양:
이메일 주소:
전화:
참조:
회사:
이름:

우리는 귀하의 정보를 누구에게도 공유하거나 판매하지 않습니다.
사생활 | 용어

All major credit cards accepted as well as gov. p-cards

이 제품의 과거 가격은 4550 and 5950 USD. 수량, 가용성, 상태, 리드 타임 및 품목 중단 가능성에 따라 최신 견적을 제공할 때까지 가격을 보장할 수 없습니다.

부품 번호
비무장화
수명
UOM
NIIN
부품 번호:
mil-hdbk-300ats
비무장화:
Yes - DEMIL/MLI
수명:
N/A
측정 단위:
1 EA
NIIN:
015777189

부품 정보
Test set, semiconductor

NSN
국가 주식 번호:
6625-01-577-7189 6625015777189
TXT
묘사:
Semiconductor Device Test Set
INC
INC
아이템 이름 코드:
25006
INC
COM
컴플라이언스:
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
110.0 volts or 240.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
Between 50.0 hertz and 400.0 hertz
MRC:
The principal parts that are included in an assembled unit.AEAS
Major Components:
Test set; pair microprobes; common test leads; shrouded test lead; power cord; cd manual
MRC:
The number of parts supplied with the item which may be required for application.AFHS
Accessory Component Quantity:
5
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of whether or not a facility/ies/ to accommodate a battery/ies/ is included.ALSF
Internal Battery Accommodation:
Not included
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
In-circuit electronic component testing
MRC:
The number of alternating current phases.FAAZ
Phase:
Single
MRC:
The alpha-numeric designation that identifies the classification of the item according to the category of functions performed.FCLS
Functional Classification:
Aa-9.6
MRC:
Those unusual or unique characteristics or qualities of an item not covered in the other requirements and which are determined to be essential for identification.FEAT
Special Features:
Meets mil-prf-28800 class 3
MRC:
Describes the capabilities,intended use,and/or purpose for which the item is provided.FTLD
Functional Description:
Used to in-circuit test semiconductor components
MRC:
Indicates the date the item was entered into mil-hdbk-300.NTRD
Entry Date:
09-09-08
MRC:
The controlling activity and identification of a document used in lieu of a specification in the procurement of an item of supply.ZZZP
Purchase Description Identification:
98752-pd09wrgbec24

{lang[cimilar]} Semiconductor Device Test Sets

« Electrical and Electronic Properties Measuring and Testing Instruments {lang[catalog]}
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