부품 번호 JANTX1N753AUR-1

Diode Semiconductor Device

가격 및 가용성

이 NSN의 현재 가격 및 가용성에 대해 이 양식을 제출하십시오.
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이메일 주소:
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사생활 | 용어

All major credit cards accepted as well as gov. p-cards

이 제품의 과거 가격은 21.08 and 28.458 USD. 수량, 가용성, 상태, 리드 타임 및 품목 중단 가능성에 따라 최신 견적을 제공할 때까지 가격을 보장할 수 없습니다.

부품 번호
비무장화
수명
UOM
NIIN
부품 번호:
jantx1n753aur-1
비무장화:
No
수명:
N/A
측정 단위:
1 EA
NIIN:
014989746
NSN
국가 주식 번호:
5961-01-498-9746 5961014989746
TXT
묘사:
Diode Semiconductor Device
INC
INC
아이템 이름 코드:
20589
MRC:
The dimension measured along the longitudinal axis with terminated points at the extreme ends of the item.ABHP
Overall Length:
Between 0.130 inches and 0.146 inches
MRC:
A measurement of the longest straight line across a circular cross-sectional plane.ADAV
Overall Diameter:
Between 0.063 inches and 0.067 inches
MRC:
The chemical compound or mechanical mixture properties of which the semiconductor is fabricated.CTMZ
Semiconductor Material:
Silicon
MRC:
The value of the voltage that may be applied,expressed in volts,and the symbol used to identify the specific electrical characteristic.CTQN
Voltage Rating In Volts Per Characteristic:
6.3 regulator voltage
MRC:
The level of electrical flow and the symbol used to identify the specific electrical characteristic.CTQX
Current Rating Per Characteristic:
65.00 milliamperes repetitive peak forward current
MRC:
The specification,standard,drawing,or similar instrument that specifies environmental and performance requirements or test conditions under which an item is tested and establishes acceptable limits within which the item must conform identified by an alphabetic and/or numeric reference number. includes the commercial and government entity (cage) code of the entity controlling the instrument.TEST
Test Data Document:
81349-mil-s-19500 specification (includes engineering type bulletins, brochures, etc., that reflect specification type data in specification format; excludes commercial catalogs, industry directories, and similar trade publications, reflecting general type data on certain environmental and performance requirements and test conditions that are shown as "typical", "average", "", etc.).

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