TXT
묘사:
Electronic System Test Set Group
MRC:
Items furnished as accessories which are not specified elsewhere.AFJH
Furnished Items:
Analyzer, network; test set, electronic; adapter set; connectors; cable assemblies; electrical standards; kit, calibration; lead test; prods test; oscilloscopes; mainframe, logic; plug-in units, electronic; disks, flexible; dolly, test equipment; trackball, data; vector voltmeter; rack, electrical equipment
MRC:
The national stock number or the identification information of the end equipment for which the item is a part.AGAV
End Application:
6625-01-339-6296
MRC:
The number of components included in the item.AJJW
Component Quantity:
144
MRC:
The originator /governmental,industrial,or otherwise/ of the available document which lists the component/s/ of the item.AJJX
Component Document Origin:
Industrial
MRC:
The commercial and government entity (cage) code of the government agency,industrial organization,or other source,which controls the document.AJJY
Document Source:
28480
MRC:
Indicates the type of document by the title.AJJZ
Document Type:
Parts list
MRC:
The page number indicating the location of the component/s/ listed in the document.AJKB
Component Document Page Number:
3 and 4 and 5 and 6 and 7 and 8 and 9 and 10 and 11 and 12 and 13
MRC:
The commercial and government entity (cage) code of the government agency,industrial organization,or other source,which controls or manufactures the end item.AJKE
End Item Source:
28480 and 98752 and 21794
MRC:
The name of the government agency or commercial organization that controls the manufacture of the accessory item.AKVY
Accessory Controlling Agency:
Hewlett packard
MRC:
The number or symbol/s/ used to identify the document.AYDR
Document Identification:
Quote3112-1933d
MRC:
The approved item name or part name of the end equipment for which the item is a part.AYDS
End Item Name:
Milstar global position system
MRC:
Describes the capabilities,intended use,and/or purpose for which the item is provided.FTLD
Functional Description:
Performs s-parameter measurements 300khz to 3ghz, phase measurements 100khz to 1ghz, and common/digital waveform analysis, ieee-488 controllable
