부품 번호 762850

Scanning Electron Microscope

가격 및 가용성

이 NSN의 현재 가격 및 가용성에 대해 이 양식을 제출하십시오.
부품 번호:
양:
이메일 주소:
전화:
참조:
회사:
이름:

우리는 귀하의 정보를 누구에게도 공유하거나 판매하지 않습니다.
사생활 | 용어

All major credit cards accepted as well as gov. p-cards

이 제품의 과거 가격은 299000 and 391000 USD. 수량, 가용성, 상태, 리드 타임 및 품목 중단 가능성에 따라 최신 견적을 제공할 때까지 가격을 보장할 수 없습니다.

부품 번호
비무장화
수명
UOM
NIIN
부품 번호:
762850
비무장화:
No
수명:
N/A
측정 단위:
1 EA
NIIN:
014867221

부품 정보
Integral wheel mounted case with slots for forklift. 1 hour setup and calibration. Software installed for specific jet engines - f110-ge-100 and -129

NSN
국가 주식 번호:
6650-01-486-7221 6650014867221
TXT
묘사:
Scanning Electron Microscope
INC
INC
아이템 이름 코드:
77777
MRC:
The dimension measured along the longitudinal axis with terminated points at the extreme ends of the item.ABHP
Overall Length:
31.000 inches
MRC:
The distance measured in a straight line from the bottom to the top of an item.ABKW
Overall Height:
67.000 inches
MRC:
An overall measurement taken at right angles to the length of an item,in distinction from thickness.ABMK
Overall Width:
31.000 inches
MRC:
The national stock number or the identification information of the end equipment for which the item is a part.AGAV
End Application:
Particle analysis of oil for f110-ge-100 & f110-ge-129 engines
MRC:
The combined group of letters,numerals,and/or symbols which compose the assigned model number of the item.AMWN
Model Number:
Jetscan
MRC:
Describes the capabilities,intended use,and/or purpose for which the item is provided.FTLD
Functional Description:
Scanning electron microscope provan off-line microscopic analysis of the magnetic chip detector debris & indicates whether maintenace is required based upon the quantity, size, & material type of the derbis
MRC:
Literature and references available for information pertaining to the item.RDAL
Reference Data And Literature:
Serd & commecial data
MRC:
Indicates the relationship,such as construction,capabilities,and the like,of the item to a similar item.RTSE
Relationship To Similar Equipment:
REPL-AC-EME-NTFO

{lang[cimilar]} Scanning Electron Microscopes

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