부품 번호 685

Semiconductor Device Test Set

가격 및 가용성

이 NSN의 현재 가격 및 가용성에 대해 이 양식을 제출하십시오.
부품 번호:
양:
이메일 주소:
전화:
참조:
회사:
이름:

우리는 귀하의 정보를 누구에게도 공유하거나 판매하지 않습니다.
사생활 | 용어

All major credit cards accepted as well as gov. p-cards
부품 번호
비무장화
수명
UOM
NIIN
부품 번호:
685
비무장화:
No
수명:
측정 단위:
NIIN:
010486404

부품 정보
Mfg name-transistor analyzer

NSN
국가 주식 번호:
6625-01-048-6404 6625010486404
TXT
묘사:
Semiconductor Device Test Set
INC
INC
아이템 이름 코드:
25006
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
115.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
60.0 hertz
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
In of out of circuit
MRC:
The number of alternating current phases.FAAZ
Phase:
Single
MRC:
Describes the capabilities,intended use,and/or purpose for which the item is provided.FTLD
Functional Description:
Analyzes pnp and npn transistors, zener diodes, and silicone controlled rectifiers

{lang[cimilar]} Semiconductor Device Test Sets

« Electrical and Electronic Properties Measuring and Testing Instruments {lang[catalog]}
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