부품 정보
Parameter readout; 3-collector supply modes; auto positioning & polarity tracking; pulsed base operation; calibrated display offset w/magnifier; kelvin sensing for high current tests; protective featrues for operator & device; quick-change line-voltage range/6-positions
TXT
묘사:
Semiconductor Device Test Set
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
11.500 inches
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
Between 90.0 volts and 272.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
Between 48.0 hertz and 66.0 hertz
MRC:
A linear measurement from the surface to a specified inner point on an item,in distinction from height.AEJZ
Depth:
23.000 inches
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Fault isolation
MRC:
The number of alternating current phases.FAAZ
Phase:
Single
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
15.000 inches
MRC:
Literature and references available for information pertaining to the item.RDAL
Reference Data And Literature:
1969 tektronix catalog and to 33a1-13-401-1
MRC:
Characteristics or qualities of an item,not covered in any other requirement,which are considered essential information for one or more functions excluding nsn assignment.SUPP
Supplementary Features:
Manufacturers name: curve tracer
