부품 번호 575

Semiconductor Device Test Set

가격 및 가용성

이 NSN의 현재 가격 및 가용성에 대해 이 양식을 제출하십시오.
부품 번호:
양:
이메일 주소:
전화:
참조:
회사:
이름:

우리는 귀하의 정보를 누구에게도 공유하거나 판매하지 않습니다.
사생활 | 용어

All major credit cards accepted as well as gov. p-cards

이 제품의 과거 가격은 2150 and 2902.5 USD. 수량, 가용성, 상태, 리드 타임 및 품목 중단 가능성에 따라 최신 견적을 제공할 때까지 가격을 보장할 수 없습니다.

부품 번호
비무장화
수명
UOM
NIIN
부품 번호:
575
비무장화:
No
수명:
N/A
측정 단위:
1 EA
NIIN:
006916529

부품 정보
Single or repetitive displays; direct comparison of transistor characteristics; selectr circuit parameters w/front panel controls; total diode measurements

NSN
국가 주식 번호:
6625-00-691-6529 6625006916529
TXT
묘사:
Semiconductor Device Test Set
INC
INC
아이템 이름 코드:
25006
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
Between 105.0 volts and 250.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Fault isolation
MRC:
The number of alternating current phases.FAAZ
Phase:
Single
MRC:
The alpha-numeric designation that identifies the classification of the item according to the category of functions performed.FCLS
Functional Classification:
Aa-9.6
MRC:
Describes the capabilities,intended use,and/or purpose for which the item is provided.FTLD
Functional Description:
Used to display dynamic characteristic curves of wide range of semiconductor devices
MRC:
Indicates the date the item was entered into mil-hdbk-300.NTRD
Entry Date:
78-09-01
MRC:
Literature and references available for information pertaining to the item.RDAL
Reference Data And Literature:
Tektronic catalog 1967
MRC:
Characteristics or qualities of an item,not covered in any other requirement,which are considered essential information for one or more functions excluding nsn assignment.SUPP
Supplementary Features:
Display area 10x10 di (5/16 in. Per div)

{lang[cimilar]} Semiconductor Device Test Sets

« Electrical and Electronic Properties Measuring and Testing Instruments {lang[catalog]}
  • 6811
    NSN: 6625-00-691-6531
  • 6827
    NSN: 6625-00-691-6533
  • 6830
    NSN: 6625-00-691-6535
  • 6831
    NSN: 6625-00-691-6536
  • 7274
    NSN: 6625-00-691-6537
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