TXT
묘사:
Semiconductor Device Test Set
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
16.750 inches
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
100.0 volts and 120.0 volts and 220.0 volts and 240.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
Between 48.0 hertz and 66.0 hertz
MRC:
The principal parts that are included in an assembled unit.AEAS
Major Components:
Semiconductor parameter analyzer 1; plug-in module 7
MRC:
A linear measurement from the surface to a specified inner point on an item,in distinction from height.AEJZ
Depth:
24.100 inches
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of whether or not a facility/ies/ to accommodate a battery/ies/ is included.ALSF
Internal Battery Accommodation:
Not included
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Multiple item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Stimulates voltage & current sensitive devices & measures resulting current & voltage responses
MRC:
The testing functions such as range,sensitivity,output,and the like,for which the item is designed.AQXZ
Operating Test Capability:
Voltage 3 ranges: porm 100 volts; current 9 ranges porm 100 milliamps
MRC:
The alpha-numeric designation that identifies the classification of the item according to the category of functions performed.FCLS
Functional Classification:
Aa-9.6
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
9.060 inches
MRC:
Indicates the date the item was entered into mil-hdbk-300.NTRD
Entry Date:
92-07-15
