부품 번호 370

Semiconductor Device Test Set

가격 및 가용성

이 NSN의 현재 가격 및 가용성에 대해 이 양식을 제출하십시오.
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이메일 주소:
전화:
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All major credit cards accepted as well as gov. p-cards
부품 번호
비무장화
수명
UOM
NIIN
부품 번호:
370
비무장화:
No
수명:
측정 단위:
NIIN:
012587065

부품 정보
7 inch diag crt; 16v, 80v, 400v, 2000v ranges

NSN
국가 주식 번호:
6625-01-258-7065 6625012587065
TXT
묘사:
Semiconductor Device Test Set
INC
INC
아이템 이름 코드:
25006
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
16.900 inches
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
115.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
60.0 hertz
MRC:
A linear measurement from the surface to a specified inner point on an item,in distinction from height.AEJZ
Depth:
25.100 inches
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Operating
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Electrostatic discharge of electrical overstress of integrated circuits
MRC:
The number of alternating current phases.FAAZ
Phase:
Single
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
13.100 inches
MRC:
Consists of plating,dip,and/or coating that cannot be wiped off.plating and/or coating is any chemical and/or metallic additive,electrochemical,or mild mechanical process which protects a surface.SURF
Surface Treatment:
Any acceptable

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