TXT
묘사:
Semiconductor Device Test Set
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
15.700 inches
MRC:
A measurement of the longest dimension of any object,in distinction from width.ABRY
Length:
17.000 inches
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
115.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
Between 50.0 hertz and 60.0 hertz
MRC:
An indication of whether or not a facility/ies/ to accommodate a battery/ies/ is included.ALSF
Internal Battery Accommodation:
Not included
MRC:
The element,compound,or mixture of which the item is fabricated,excluding any surface treatment,and its location.ANNQ
Material And Location:
Leather carrying case
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/carrying case
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Measure transistor characteristics; measure diodes
MRC:
The number of alternating current phases.FAAZ
Phase:
Single
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
7.000 inches
MRC:
The justification for the assignment of a federal supply class /fsc/ to an item based on the classification of the next higher classifiable assembly.ZZZV
Fsc Application Data:
Test set, transistor, except specially designed
