부품 번호 219Z

Semiconductor Device Test Set

가격 및 가용성

이 NSN의 현재 가격 및 가용성에 대해 이 양식을 제출하십시오.
부품 번호:
양:
이메일 주소:
전화:
참조:
회사:
이름:

우리는 귀하의 정보를 누구에게도 공유하거나 판매하지 않습니다.
사생활 | 용어

All major credit cards accepted as well as gov. p-cards

이 제품의 과거 가격은 900 and 1215 USD. 수량, 가용성, 상태, 리드 타임 및 품목 중단 가능성에 따라 최신 견적을 제공할 때까지 가격을 보장할 수 없습니다.

부품 번호
비무장화
수명
UOM
NIIN
부품 번호:
219z
비무장화:
No
수명:
N/A
측정 단위:
1 EA
NIIN:
008447105

부품 정보
Contains 2 seperate 12 volt battery supplies; housed in plastic case/housing with handle

NSN
국가 주식 번호:
6625-00-844-7105 6625008447105
TXT
묘사:
Semiconductor Device Test Set
INC
INC
아이템 이름 코드:
25006
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
7.625 inches
MRC:
A measurement of the longest dimension of any object,in distinction from width.ABRY
Length:
9.000 inches
MRC:
The value,or range of values,of direct current potential for which the item is rated.ACYR
Dc Voltage Rating:
12.0 volts
MRC:
An indication of whether or not a facility/ies/ to accommodate a battery/ies/ is included.ALSF
Internal Battery Accommodation:
Included
MRC:
The element,compound,or mixture of which the item is fabricated,excluding any surface treatment,and its location.ANNQ
Material And Location:
Plastic housing
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/housing
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Indicates leakage current, measures transistor beta in circuit
MRC:
The testing functions such as range,sensitivity,output,and the like,for which the item is designed.AQXZ
Operating Test Capability:
Beta range 1 to 120; leakage current range 0 to 500 ua
MRC:
The alpha-numeric designation that identifies the classification of the item according to the category of functions performed.FCLS
Functional Classification:
Aa-9.3
MRC:
Describes the capabilities,intended use,and/or purpose for which the item is provided.FTLD
Functional Description:
Self-contained portable instrument that measures the beta parameter of a transistor without removing the transistor from the circuit
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
6.500 inches
MRC:
Literature and references available for information pertaining to the item.RDAL
Reference Data And Literature:
T.O. 33a1-12-287-11

{lang[cimilar]} Semiconductor Device Test Sets

« Electrical and Electronic Properties Measuring and Testing Instruments {lang[catalog]}
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