TXT
묘사:
Semiconductor Device Test Set
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
9.000 inches
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
Between 50.0 hertz and 2000.0 hertz
MRC:
A linear measurement from the surface to a specified inner point on an item,in distinction from height.AEJZ
Depth:
11.000 inches
MRC:
The relationship of the electrical power source to the item.AKWC
Electrical Power Source Relationship:
Alternate operating
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/carrying case
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Leakage, bonding, failure, shorts, opens
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
4.000 inches
MRC:
Characteristics or qualities of an item,not covered in any other requirement,which are considered essential information for one or more functions excluding nsn assignment.SUPP
Supplementary Features:
Impedance ranges: open circuit voltage 10vp, 15vp, 20vp, 60vp; short circuit current 135marms, 9.0marms, 0.6marms
