TXT
묘사:
Semiconductor Device Test Set
MRC:
A measurement taken at right angles to the length of an item,in distinction from thickness.ABGL
Width:
12.875 inches
MRC:
A measurement of the longest dimension of any object,in distinction from width.ABRY
Length:
13.875 inches
MRC:
The value,or range of values,of root mean square potential for which the item is rated.ACYN
Ac Voltage Rating:
115.0 volts
MRC:
The number of complete cyclic changes,per unit of time,for which an item is rated.ACZB
Frequency Rating:
Between 50.0 hertz and 420.0 hertz
MRC:
An indication of whether or not a facility/ies/ to accommodate a battery/ies/ is included.ALSF
Internal Battery Accommodation:
Not included
MRC:
The element,compound,or mixture of which the item is fabricated,excluding any surface treatment,and its location.ANNQ
Material And Location:
Fiberglass carrying case
MRC:
An indication of the feature/s/ of the inclosure.ANPZ
Inclosure Feature:
Single item w/carrying case
MRC:
Indicates the type of test for which the item is designed.AQXY
Test Type For Which Designed:
Transistors - icbo, iebo, iceo, b hfe; diodes - irev, vfwd, ifwd
MRC:
The testing functions such as range,sensitivity,output,and the like,for which the item is designed.AQXZ
Operating Test Capability:
Poscillator freq 1 khz, output 10v; volt-ammeter range 0 to 10/100v dc, range 0 to 0.02/0.1/0.5/2/5 ma dc; ammeter range 0 to 0.02/0.1/2/5/20/50/200/500 ma dc; collector supply 0-10/100 v dc; base bias supply 0-5 ma dc
MRC:
The number of alternating current phases.FAAZ
Phase:
Single
MRC:
A measurement from the bottom to the top of an object,in distinction from depth.HGTH
Height:
8.750 inches
