부품 번호 05350-60005

Electrical Test Set Subassembly

가격 및 가용성

이 NSN의 현재 가격 및 가용성에 대해 이 양식을 제출하십시오.
부품 번호:
양:
이메일 주소:
전화:
참조:
회사:
이름:

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All major credit cards accepted as well as gov. p-cards

이 제품의 과거 가격은 919.28 and 1241.028 USD. 수량, 가용성, 상태, 리드 타임 및 품목 중단 가능성에 따라 최신 견적을 제공할 때까지 가격을 보장할 수 없습니다.

부품 번호
비무장화
수명
UOM
NIIN
부품 번호:
05350-60005
비무장화:
Yes - DEMIL/MLI
수명:
N/A
측정 단위:
1 EA
NIIN:
013126883

부품 정보
Component type and quantity: integrated circuit 10; mounting configuration: plug-in; weapon system essential

NSN
국가 주식 번호:
6625-01-312-6883 6625013126883
TXT
묘사:
Electrical Test Set Subassembly
INC
INC
아이템 이름 코드:
42648
INC
COM
컴플라이언스:
* ITAR Controlled
MRC:
The dimension measured along the longitudinal axis with terminated points at the extreme ends of the item.ABHP
Overall Length:
7.000 inches
MRC:
The distance measured in a straight line from the bottom to the top of an item.ABKW
Overall Height:
0.687 inches
MRC:
An overall measurement taken at right angles to the length of an item,in distinction from thickness.ABMK
Overall Width:
4.060 inches
MRC:
The national stock number or the identification information of the end equipment for which the item is a part.AGAV
End Application:
Zforrestal class cv, kidd class ddg, los angeles class ssn (688), virginia class cgn (41), sturgeon class ssn (637), arleigh burke class ddg, spruance class dd (963), oliver perry class ffg, nimitz class cvn, ticonderoga class cg (47)
MRC:
Those features,not otherwise specified,which may be required for proper functioning of the item.CBBL
Features Provided:
Electrostatic sensitive
MRC:
The master requirement codes of those requirements which are technically critical by reason of tolerance,fit,performance,or other characteristics which affect identification of the item.CRTL
Criticality Code Justification:
Feat
MRC:
Indicates the type and number of components which make up the assembly or subassembly.CXCK
Component Type And Quantity:
74 capacitor and 13 diode and 1 printed wiring board and 38 resistor and 7 transistor

{lang[cimilar]} Electrical Test Set Subassemblies

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