Miscellaneous Simplified Test Equipment Parts

End item NSN parts page 1 of 1
Part Number
NSN
NIIN
10082796 Engine Analyzer Set
012226589
10087197 Connector Adapter
010946711
10087280 Electrical Power Cable Assembly
010549744
10087335 Electrical Power Cable Assembly
010575818
10087336 Electrical Power Cable Assembly
010575819
10087441 Pressure Transmitter
010678952
10087446 Test Probe
010594279
10087454 Force-weight Load Cell
010678954
10087457 Vibrating Reed Tachometer
010607175
10087468 Fluid Pressure Dampener
010693385
12258784 Electrical Power Cable Assembly
010575818
12258786 Electrical Power Cable Assembly
010575819
12258788 Electrical Power Cable Assembly
010549744
12258837-2 Voltage Regulator
011028431
12258865 Film Fixed Resistor Network
011027253
12258875 Vibrating Reed Tachometer
010607175
12258876 Force-weight Load Cell
010678954
12258877 Pressure Transmitter
010678952
12258878 Test Probe
010594279
12258881 Fluid Pressure Dampener
010693385
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Miscellaneous Simplified Test Equipment

Picture of Miscellaneous Simplified Test Equipment

Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

Practical electronics engineering and assembly requires the use of many different kinds of electronic test equipment ranging from the very simple and inexpensive (such as a test light consisting of just a light bulb and a test lead) to extremely complex and sophisticated such as automatic test equipment (ATE). ATE often includes many of these instruments in real and simulated forms.

Generally, more advanced test gear is necessary when developing circuits and systems than is needed when doing production testing or when troubleshooting existing production units in the field.

The addition of a high-speed switching system to a test system’s configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system’s switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well as the switching hardware form factors available.

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